The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Apr. 24, 2006
Ren-sue Wong, Sunnyvale, CA (US);
Ren-Sue Wong, Sunnyvale, CA (US);
ICF Technology Limited., Santa Clara, CA (US);
Abstract
An inspecting system () includes a stage (), a white light source (), a CCD camera (), a laser diode assembly (), at least one beam splitter (), a photo diode (), and an oscilloscope (). The white light source emits a white light () to illuminate a color filter (). The CCD camera photographs the color filter and is linked with an image processing and displaying device (). The laser diode assembly emits a laser light (). The at least one beam splitter is arranged in a path of the laser light and transmits the laser light to the color filter. The photo diode receives the laser light reflected by the color filter and generates an electronic signal. The oscilloscope is connected with the photo diode and displays the electronic signal. The inspecting system facilitates the convenient and accurate inspection/evaluation of color filters.