The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Mar. 05, 2004
Hideki Ninomiya, Takamatsu, JP;
Koji Ichikawa, Takamatsu, JP;
Ken Kawahara, Takamatsu, JP;
Hirofumi Miki, Takamatsu, JP;
Tasuku Moriya, Takamatsu, JP;
Hideki Ninomiya, Takamatsu, JP;
Koji Ichikawa, Takamatsu, JP;
Ken Kawahara, Takamatsu, JP;
Hirofumi Miki, Takamatsu, JP;
Tasuku Moriya, Takamatsu, JP;
Shikoku Research Institute Incorporated, Takamatsu-shi, Kagawa, JP;
Abstract
A gas leakage monitoring method and system capable of ensuring safety of a gas utilization facility by visualizing invisible-to-naked-eye leakage gas and/or flame of leakage gas into the form of an image. The gas leakage monitoring method comprises the steps of collecting a detected light of a particular wavelength, which is caused by leakage gas and/or a flame of the leakage gas, in a space to be monitored, converting the detected light into an electronic image, amplifying and then converting the electronic image into an optical image again, and imaging the spatial intensity distribution of the particular wavelength light. The gas leakage monitoring system comprises first means for collecting a detected light of a particular wavelength, which is caused by leakage gas and/or a flame of the leakage gas, in a space to be monitored, second means for converting the detected light into an electronic image, and amplifying and then converting the electronic image into an optical image again, and third means for imaging the spatial intensity distribution of the particular wavelength light.