The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Sep. 15, 2004
Applicants:

Giuseppe LI Puma, Bochum, DE;

Duyen Pham-stäbner, Ratingen, DE;

Elmar Wagner, Duisburg, DE;

Inventors:

Giuseppe Li Puma, Bochum, DE;

Duyen Pham-Stäbner, Ratingen, DE;

Elmar Wagner, Duisburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An arrangement for testing a plurality of capacitances in a capacitance array of an integrated circuit includes a power supply and a means for cyclically charging and discharging at least one of the capacitances. In this arrangement, the cycle frequency is dependent on the value of the capacitance. The cycle frequency or a quantity characteristic associated therewith is measured by a means to ascertain a value of the capacitance under test.


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