The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Jul. 04, 2005
Applicants:

Ingolf Weingaertner, Braunschweig, DE;

Clemens Elster, Berlin, DE;

Michael Schulz, Isenbuttel, DE;

Inventors:

Ingolf Weingaertner, Braunschweig, DE;

Clemens Elster, Berlin, DE;

Michael Schulz, Isenbuttel, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01V 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a measuring arrangement comprising a sensor head () that can be displaced over a surface () at a distance therefrom in a scanning direction (R), a plurality of distance sensors which are suitable for distance measurement and are interspaced in the scanning direction in a fixed manner, a displacement device for displacing the sensor head () in such a way that points of the surface () are detected in successive scanning steps carried out by a plurality of distance sensors, and an evaluation device to which the output signals of the distance sensors are supplied. According to the invention, one such measuring arrangement is improved by an angle measuring device () for determining an angle value of the sensor head () in relation to the scanning direction (R), and for forwarding said angle value to the evaluation device. In this way, systematic measuring errors can be eliminated for the reconstruction of a topography of the surface () in the scanning direction (R). Furthermore, the sensor head () can be calibrated by means of the measuring arrangement.


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