The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Jan. 31, 2005
Applicants:

Changsheng Liu, State College, PA (US);

Hequan Zhao, State College, PA (US);

Inventors:

Changsheng Liu, State College, PA (US);

Hequan Zhao, State College, PA (US);

Assignee:

Applera Corporation, Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 27/453 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrophoretic system having a plurality of separation lanes is provided with an automatic calibration feature in which each lane is separately calibrated. For each lane, the calibration coefficients map a spectrum of received channel intensities onto values reflective of the relative likelihood of each of a plurality of dyes being present. Individual peaks, reflective of the influence of a single dye, are isolated from among the various sets of detected light intensity spectra, and these can be used to both detect the number of dye components present, and also to establish exemplary vectors for the calibration coefficients which may then be clustered and further processed to arrive at a calibration matrix for the system. The system of the present invention thus permits one to use different dye sets to tag DNA nucleotides in samples which migrate in separate lanes, and also allows for in-situ calibration with new, previously unused dye sets.


Find Patent Forward Citations

Liu, Changsheng. (2008). Electrophoretic analysis system having in-situ calibration (U.S. Patent No. 7384525). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7384525

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