The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Mar. 31, 2005
Chih-lin Huang, Bellevue, WA (US);
Stanley L. Floyd, Enumclaw, WA (US);
Chih-Lin Huang, Bellevue, WA (US);
Stanley L. Floyd, Enumclaw, WA (US);
Weyerhaeuser Company, Federal Way, WA (US);
Abstract
Methods for evaluating properties of a material are provided. In a first method, the velocity of a stress or sound wave is calculated by measuring the time of flight of the stress/sound wave induced into the material. The resonance of the material is also measured after the wood product is contacted. A separate velocity of the sound wave within the material is calculated using the resonance measurements. A comparison of the individual velocities provides an indication of the homogeneity of properties of the material. The properties may be, for example, stiffness, strength, various gradients or the like. In a second method of the present invention, the velocity calculated using the time of flight method may be used as a guide in determining a fundamental frequency for the stress wave within a material and resultant velocity. The material may be, for example, wood, metal, plastic or the like.