The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Mar. 08, 2005
Kenji Iwamura, Austin, TX (US);
Kenji Iwamura, Austin, TX (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
Systems and methods for performing design verification testing in which test cases are analyzed to determine the characteristics that will be verified in a module under test, and in which the identified characteristics are used to selectively enable checker modules needed to verify the characteristics implicated by the test cases, while disabling other checker modules. In one embodiment, a system includes a test case analyzer and a checker selector. The test case analyzer analyzes one or more test cases and identifies test case characteristics that are associated with each of the test cases. The checker selector is coupled to the test case analyzer and receives identification of the test case characteristics from the test case analyzer. The checker selector then selectively enables a first set of design verification checkers and disables a second set, based on the test case characteristics identified for the test cases.