The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Dec. 13, 2005
Scott Shelton, Apex, NC (US);
Henry Fu, Chapel Hill, NC (US);
Steven Kennedy, Wendell, NC (US);
Jason Figge, Cary, NC (US);
Michael Chaves, Cary, NC (US);
Harold Lee, Holly Springs, NC (US);
Scott Shelton, Apex, NC (US);
Henry Fu, Chapel Hill, NC (US);
Steven Kennedy, Wendell, NC (US);
Jason Figge, Cary, NC (US);
Michael Chaves, Cary, NC (US);
Harold Lee, Holly Springs, NC (US);
Teradata US, Inc., Miamisburg, OH (US);
Abstract
Techniques are presented for reusing business measures within a data store. A measure is associated with a measure type. Each measure is associated with a particular data store schema or schema element and includes metadata for fields and calculations against those fields. Requestors can select existing measures, create new measures, delete existing measures, and/or modify existing measures. A measure, when processed against the data store, produces results from a data store that are associated with the data store schema or the schema element and which conform to the fields and calculations defined within the measure's metadata.