The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Apr. 27, 2005
Yoshiyuki Tani, Osaka, JP;
Hiroshi Iwamoto, Osaka, JP;
Takao Hisazumi, Osaka, JP;
Yukihiro Iwata, Osaka, JP;
Etsuyoshi Sakaguchi, Osaka, JP;
Yoshiyuki Tani, Osaka, JP;
Hiroshi Iwamoto, Osaka, JP;
Takao Hisazumi, Osaka, JP;
Yukihiro Iwata, Osaka, JP;
Etsuyoshi Sakaguchi, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.