The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Oct. 26, 2005
Atsuhiro Tsuchiya, Tokyo, JP;
Katsuyoshi Yamaguchi, Tokyo, JP;
Akitsugu Kagayama, Tokyo, JP;
Kazuhiro Hasegawa, Tokyo, JP;
Hideaki Endo, Tokyo, JP;
Kenichi Koyama, Kanagawa, JP;
Atsuhiro Tsuchiya, Tokyo, JP;
Katsuyoshi Yamaguchi, Tokyo, JP;
Akitsugu Kagayama, Tokyo, JP;
Kazuhiro Hasegawa, Tokyo, JP;
Hideaki Endo, Tokyo, JP;
Kenichi Koyama, Kanagawa, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The problem to be solved by the present invention is to provide a microscope that prevents a dew condensation on an objective lens and allows obtaining a good microscopic image, and a method of preventing a dew condensation on an objective lens. A microscope includes an objective lens having a heaterin a cell incubatorhaving a high humidity space. The high humidity space is maintained at 90% to 100% of relative humidity and controlled to be at a predetermined gas temperature. A cultured cellin the cell incubatoris observed via the objective lens, and the heateris controlled to make the temperature of the objective lenshigher than the gas temperature of the high humidity space.