The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Dec. 22, 2005
Ernest A. Franke, San Antonio, TX (US);
Michael J. Magee, Rio Medina, TX (US);
Michael P. Rigney, San Antonio, TX (US);
Joseph N. Mitchell, San Antonio, TX (US);
Robert J. Beeson, Catonsville, MD (US);
Ernest A. Franke, San Antonio, TX (US);
Michael J. Magee, Rio Medina, TX (US);
Michael P. Rigney, San Antonio, TX (US);
Joseph N. Mitchell, San Antonio, TX (US);
Robert J. Beeson, Catonsville, MD (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images of the rotating pattern moving across the object with an image receiving device and calculating the surface profile of the object. Other embodiments can include a method to calibrate the system and a non-contact apparatus that generally includes a point-type light source, a rotatably mounted optical grating being configured to project a moving grating image on the object, a processor in communication with the image capturing device and configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom.