The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Apr. 03, 2004
Michael Lindner, Leutenbach, DE;
Michael Lindner, Leutenbach, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An interferometric measuring device for measuring the shape or profile of a surface of an object by depth scanning includes a radiation source emitting a short coherent beam, a beam splitter for forming an object beam guided by panorama optics to the object via an object light path and a reference beam guided to a reflecting reference element via a reference light path, and an image pick-up which receives the radiation reflected by the object and the reference element and brought into interference and transmits it to an evaluator for determining the surface shape. An accurate and rapid measurement of surfaces, e.g., in narrow cavities, may be accomplished relatively easily in that a reference surface oriented at an angle to the object surface is formed by the reference element, and the measuring device is configured so that the depth scanning for measuring shape is accomplished by laterally moving the object in relation to the object beam.