The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Nov. 20, 2003
Yukio Higashiisogawa, Kyoto, JP;
Junichi Oka, Kyoto, JP;
Tetsuaki Saiji, Kyoto, JP;
Arkray, Inc., Kyoto, JP;
Abstract
The present invention relates to an analyzing device provided with: a light-measuring mechanism () that includes a light-emitting unit for emitting light onto a test tool () to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (); and a detecting mechanism () for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool () and a light-receiving unit for receiving reflection light from the test tool (). In the light-measuring mechanism (), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other. The detecting mechanism () is arranged such that the one or more light-receiving units selectively receive regularly-reflected light from the test tool () among the light emitted from the light-emitting unit.