The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2008

Filed:

Dec. 07, 2006
Applicants:

Fumio Ohtomo, Itabashi-ku, JP;

Masahiro Ohishi, Itabashi-ku, JP;

Ikuo Ishinabe, Itabashi-ku, JP;

Kazuhiro Shida, Itabashi-ku, JP;

Inventors:

Fumio Ohtomo, Itabashi-ku, JP;

Masahiro Ohishi, Itabashi-ku, JP;

Ikuo Ishinabe, Itabashi-ku, JP;

Kazuhiro Shida, Itabashi-ku, JP;

Assignee:

Kabushiki Kaisha TOPCON, Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distance measuring method for performing distance measurement by projecting a distance measuring light to an object to be measured and by receiving a reflected light, comprising: a step of projecting for scanning the distance measuring light which has at least one luminous flux with a predetermined spreading angle; a step of emitting the light by pulsed light emission at least two times during a period when the luminous flux traverses the object to be measured; a step of measuring a distance by receiving the reflected light at least two times; and a step of averaging the results of the distance measurement.


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