The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7381955 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 03, 2008

Filed:

Mar. 18, 2004
Applicants:

Yuki Watanabe, Wako, JP;

Kodo Kawase, Wako, JP;

Tomofumi Ikari, Wako, JP;

Inventors:

Yuki Watanabe, Wako, JP;

Kodo Kawase, Wako, JP;

Tomofumi Ikari, Wako, JP;

Assignee:

Riken, Saitama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes a spectroscopic measurement step of pre-measuring a spectrum [S] of tera-hertz wave absorbencies of a target component for a plurality of frequencies ranging about from 1 THz to 3 THz, and an object spectroscopic step of irradiating an object with tera-hertz waves of the plurality of frequencies to measure absorbencies I of the object. Presence and absence of the target component in the object is determined on the basis of the spectrum [S] of the absorbancy S and the spectrum [I] of the absorbancy I of the object.


Find Patent Forward Citations

Watanabe, Yuki. (2008). Method and apparatus for inspecting target by tera-hertz wave spectrometry (U.S. Patent No. 7381955). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7381955

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…