The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Apr. 28, 2005
Systems and methods for ion species analysis with enhanced condition control and data interpretation
Douglas B. Cameron, Wellesley, MA (US);
David B. Wheeler, Haverhill, MA (US);
Quan Shi, Westford, MA (US);
Raanan A. Miller, Chestnut Hill, MA (US);
Erkinjon G. Nazarov, Lexington, MA (US);
Evgeny Krylov, Lowell, MA (US);
Stephen Coy, Wayland, MA (US);
Gary A. Eiceman, Las Cruces, NM (US);
Douglas B. Cameron, Wellesley, MA (US);
David B. Wheeler, Haverhill, MA (US);
Quan Shi, Westford, MA (US);
Raanan A. Miller, Chestnut Hill, MA (US);
Erkinjon G. Nazarov, Lexington, MA (US);
Evgeny Krylov, Lowell, MA (US);
Stephen Coy, Wayland, MA (US);
Gary A. Eiceman, Las Cruces, NM (US);
Sionex Corporation, Bedford, MA (US);
Abstract
The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample detection using enhanced condition control and data interpretation.