The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2008

Filed:

Jun. 07, 2004
Applicants:

Allan Tit-shing Chow, Wilmington, DE (US);

William Jackson Devlin, Sr., Lincoln University, PA (US);

Timothy Patrick Evers, Wilmington, DE (US);

David Russell Thompson, Kennett Square, PA (US);

Inventors:

Allan Tit-Shing Chow, Wilmington, DE (US);

William Jackson Devlin, Sr., Lincoln University, PA (US);

Timothy Patrick Evers, Wilmington, DE (US);

David Russell Thompson, Kennett Square, PA (US);

Assignee:

Dade Behring Inc., Deerfield, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automated analyzer for analyzing patient samples. The analyzer includes a plurality of cuvettes, which allow the samples to be mixed with various reagents. The analyzer includes one or more detectors, including a detector adapted to detect luminescence of the reaction mixture in the cuvettes. The analyzer allows for various diagnostic assays to be performed on a single system, and provides for high-sensitivity analysis at faster speeds.


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