The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2008
Filed:
Oct. 06, 2003
Sergiy Molebny, Houston, TX (US);
Vasyl Molebny, Kiev, UA;
Lamar Frederick Laster, Houston, TX (US);
Sergiy Molebny, Houston, TX (US);
Vasyl Molebny, Kiev, UA;
LaMar Frederick Laster, Houston, TX (US);
Other;
Abstract
Provided herein are methods for measuring wave aberrations of the eye. Retinal scattered radiation from a probing laser beam is detected, the wave front tilt is measured as first partial derivatives along known coordinates in a discrete set of the pupil points, the wave front is approximated from this data as functions of the pupil coordinates and the wave aberrations of the eye are thereby calculated. Partial derivatives are determined at any pupil point by spline approximation using the values in a discrete number of points in which the wave front tilts are measured. This set of points may be located along concentric circles or along one of the orthogonal axes. The wave front is reconstructed using numerical integration along the radii with the initial integration point in the center of the pupil. Wave aberrations are calculated from wave front data reconstructed in the form of splines.