The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2008

Filed:

May. 11, 2004
Applicants:

In-joon Yeo, Gyeonggi-do, KR;

Il-sang Lee, Gyeonggi-do, KR;

Kang-youn Lee, Gyeonggi-do, KR;

Inventors:

In-joon Yeo, Gyeonggi-do, KR;

Il-sang Lee, Gyeonggi-do, KR;

Kang-youn Lee, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B08B 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

Wafer cleaning apparatus include a cleaning tub configured to receive a wafer to be cleaned. A wafer cleaning unit coupled to the cleaning tub is configured to provide wafer cleaning solution to the wafer. A probe is positioned in the cleaning tub proximate the wafer. The probe is configured to provide megasonic vibrational energy to a surface of the wafer and/or the wafer cleaning solution to separate contaminants from the surface of the wafer. A probe cleaning unit is configured to provide a probe cleaning solution to the probe to clean the probe. Methods of using the wafer cleaning apparatus are also provided.


Find Patent Forward Citations

Yeo, In-joon. (2008). Wafer cleaning apparatus with probe cleaning and methods of using the same (U.S. Patent No. 7380560). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7380560

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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