The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2008

Filed:

Nov. 23, 1998
Applicant:

Steven Eugene Lovette, Keller, TX (US);

Inventor:

Steven Eugene Lovette, Keller, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for detecting corruption associated with a stack in a storage device is disclosed. In one embodiment, the technique is realized by having a processing device insert a quantity of information adjacent to the stack in the storage device, wherein the quantity of information has an initial state. The processing device then inspects the quantity of information so as to identify any deviation from the initial state and thereby detect corruption associated with the stack in the storage device.


Find Patent Forward Citations

Lovette, Steven. (2008). Technique for detecting corruption associated with a stack in a storage device (U.S. Patent No. 7380245). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7380245

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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