The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Nov. 27, 2002
Michael Roy Pokorny, Neenah, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Winnie Shi Mei Shun Hoo, Appleton, WI (US);
Jeffrey Dean Lindsay, Appleton, WI (US);
Charles Earl Markham, Appleton, WI (US);
Jon Ray Matheus, Appleton, WI (US);
Jamie Scott Mork, Greenville, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Jose Andres Stambuk, Appleton, WI (US);
Michael Roy Pokorny, Neenah, WI (US);
Douglas Gordon Barron Barber, Appleton, WI (US);
Winnie Shi Mei Shun Hoo, Appleton, WI (US);
Jeffrey Dean Lindsay, Appleton, WI (US);
Charles Earl Markham, Appleton, WI (US);
Jon Ray Matheus, Appleton, WI (US);
Jamie Scott Mork, Greenville, WI (US);
Kurt Sigurd Nygaard, Appleton, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Jose Andres Stambuk, Appleton, WI (US);
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
User interface for reporting event-based production information in product manufacturing. Some of the disclosed embodiments include a system, method, computer-readable medium, and display device for processing data stored in a database. The data includes automatically collected event-based production information records in a manufacturing system wherein each record represents an event and includes a timestamp, an event code, and a measure of cost or production loss associated with the event. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.