The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2008

Filed:

Nov. 20, 2006
Applicants:

Yong Cheol Park, Kyonggi-do, KR;

Myonggu Lee, Kyonggi-do, KR;

Jong IN Shin, Kyonggi-do, KR;

Kyu Hwa Jeong, Kyonggi-do, KR;

Inventors:

Yong Cheol Park, Kyonggi-do, KR;

MyongGu Lee, Kyonggi-do, KR;

Jong In Shin, Kyonggi-do, KR;

Kyu Hwa Jeong, Kyonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a recording medium and apparatus and method for managing defective areas in the recording medium. According to an embodiment, the method includes (a) reading a defect management information recorded on a defect management area, the defect management information including second information specifying a location of a replacement area to replace the defective area and status information specifying whether or not the defective area is replaced; (b) identifying the defect management information; and (c) controlling a writing operation according to the result of step (b).


Find Patent Forward Citations

Loading…