The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2008

Filed:

Feb. 15, 2006
Applicants:

Suk-han Lee, Yongin-si, KR;

Seong-soo Lee, Suwon-si, KR;

Jang-yong Lee, Seoul, KR;

Seung-min Baek, Suwon-si, KR;

Inventors:

Suk-Han Lee, Yongin-si, KR;

Seong-Soo Lee, Suwon-si, KR;

Jang-Yong Lee, Seoul, KR;

Seung-Min Baek, Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a technique for obtaining an estimate and variance of each variable based on a constraint manifold. Particles (or samples) are sampled in order to filter and fuse ambiguous data or information on at least one state variable of a system using the particles. The sampling is carried out in consideration of an influence which non-linearity of the constraint manifold of a system model, an observation model or another system model exerts on a probability distribution of the state variable. With this construction, it is possible to reduce decrease of fusion and filtering performance, decrease a Gaussian approximation error, and detect mismatched information.


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