The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2008

Filed:

Jun. 04, 2003
Applicants:

Kai Yung, Livermore, CA (US);

Sylvia H. Fang, Fremont, CA (US);

John Rohrlich, Niwot, CO (US);

Inventors:

Kai Yung, Livermore, CA (US);

Sylvia H. Fang, Fremont, CA (US);

John Rohrlich, Niwot, CO (US);

Assignee:

Applera Corporation, Foster City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and methods for integrating laboratory instrumentation and applications to provide a unified control and coordination architecture under a common interface. The system may be adapted to a variety of different hardware and software components wherein the individual functionalities and input/output data types for each component are recognized and incorporated into a centralized control and monitoring system.


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