The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Jun. 29, 2005
Daniel Joseph Cleary, Schenectady, NY (US);
Lijie Yu, Clifton Park, NY (US);
Mark David Osborn, Schenectady, NY (US);
Daniel Joseph Cleary, Schenectady, NY (US);
LiJie Yu, Clifton Park, NY (US);
Mark David Osborn, Schenectady, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for diagnosing and classifying faults in a system is provided. The method comprises acquiring operational data for at least one of a system, one or more subsystems of the system or one or more components of the one or more subsystems. Then, the method comprises analyzing the operational data using one or more diagnostic models. Each diagnostic model uses the operational data to determine a probability of fault associated with at least one of the one or more components or the one or more subsystems. Finally, the method comprises deriving an overall probability of fault for at least one of the system, the one or more subsystems, or the one or more components using the one or more probabilities of fault determined by the one or more diagnostic models and one or more hierarchical relationships between the subsystems and components of the system.