The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Apr. 14, 2006
Zachary Cole, Bozeman, MT (US);
Randy R. Reibel, Bozeman, MT (US);
Krishna Mohan Rupavatharam, Bozeman, MT (US);
William R. Babbitt, Bozeman, MT (US);
Kristian D. Merkel, Bozeman, MT (US);
Tiejun Chang, Bozeman, MT (US);
Zachary Cole, Bozeman, MT (US);
Randy R. Reibel, Bozeman, MT (US);
Krishna Mohan Rupavatharam, Bozeman, MT (US);
William R. Babbitt, Bozeman, MT (US);
Kristian D. Merkel, Bozeman, MT (US);
Tiejun Chang, Bozeman, MT (US);
Montana State University, Bozeman, MT (US);
Abstract
Techniques for detecting optical spectral properties of a target are described. The technique includes providing an optical carrier which has an optical frequency bandwidth which is narrow compared to the width of the narrowest spectral feature of the target to be determined. This optical carrier is then electro-optically modulated with an RF frequency chirp, creating an optical chirp probe beam with a frequency chirped optical spectrum having upper and lower frequency chirped sidebands that have amplitudes sufficient to be detected at a detector. The sidebands are frequency bands arranged symmetrically around the optical carrier frequency. The attributes of a sideband include a start frequency, bandwidth and chirp rate. A probe beam is generated with the sidebands and directed onto a target having a physical property with optical frequency dependence. An optical response signal resulting from an interaction between the probe beam and the target is detected. The optical frequency dependence of the physical property of the target is determined based on the optical response signal and the attributes of the sidebands.