The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Mar. 09, 2005
Roger Mitsuo Ikeda, Plano, TX (US);
Jeffrey Matthew Kempf, Dallas, TX (US);
Roger Mitsuo Ikeda, Plano, TX (US);
Jeffrey Matthew Kempf, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A digital keystone correction process locates image points in a corrected image from image points in a distorted image that was produced by misalignment of the axis of a sensor such as a camera. The correction process locates corrected image points by constructing intercept points that are the intersections of the extended sides of a quadrilateral in the distorted image plane that is constructed from a known rectangular feature in the subject plane. Reference points are located by drawing a line through each intercept point and the distorted image point. Distances are found from the intercept points to the image points and the reference points. The distances are scaled and corrected with an offset to locate the coordinates of the image points in the corrected image plane. This process can correct alignment errors of pitch, yaw, and roll between the subject plane and an image plane such as photographic film.