The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Dec. 02, 2004
Raghav Raman, Cupertino, CA (US);
Bhargav Raman, San Jose, CA (US);
Sandy A. Napel, Menlo Park, CA (US);
Geoffrey D. Rubin, Woodside, CA (US);
Raghav Raman, Cupertino, CA (US);
Bhargav Raman, San Jose, CA (US);
Sandy A. Napel, Menlo Park, CA (US);
Geoffrey D. Rubin, Woodside, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A method to quantify the vascular irregularity of aortoiliac arteries is provided. Inner wall and/or outer wall outlines of a vessel of interest are determined. The cross sectional area is determined for the area outlined by each outline. Using this cross sectional area a shape is selected that has substantially the same area as the outline. Subsequently, the shape is fitted to the outline. In one aspect, the irregularity index is calculated as the ratio of the outline and the outline of the fitted shape. In another aspect, the irregularity index is calculated as the ratio of at least a part of the outline and the outline of the fitted shape that corresponds to the same part of the outline. The irregularity index is visualized using a color scheme, a range of numbers, or a set of labels.