The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7379349 B1

PDF
Full Text
Expired
Date of Patent:
May. 27, 2008

Filed:

Jul. 15, 2004
Applicant:

Kenji Motomochi, Osaka, JP;

Inventor:

Kenji Motomochi, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device includes: a plurality of memory macros, each of which includes a plurality of memory cells, is activated in accordance with a corresponding active macro selection signal, and operates in an active mode according to a corresponding active mode control signal; and a control unit for generating and outputting, in accordance with an input operation mode control signal, the active macro selection signals and the active mode control signals that correspond to the respective memory macros, so that two or more of the memory macros are activated simultaneously.


Find Patent Forward Citations

Motomochi, Kenji. (2008). Simultaneous and selective memory macro testing (U.S. Patent No. 7379349). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7379349

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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