The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2008

Filed:

Jan. 26, 2006
Applicants:

Stephane Vannuffelen, Tokyo, JP;

Akira Kamiya, Sagamihara, JP;

Masaki Miyashita, Hachioji, JP;

Kentaro Indo, Machida, JP;

Reinhart Ciglenec, Katy, TX (US);

Tsutomu Yamate, Yokohama, JP;

Inventors:

Stephane Vannuffelen, Tokyo, JP;

Akira Kamiya, Sagamihara, JP;

Masaki Miyashita, Hachioji, JP;

Kentaro Indo, Machida, JP;

Reinhart Ciglenec, Katy, TX (US);

Tsutomu Yamate, Yokohama, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 21/00 (2006.01); G01V 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fluid analysis system for use downhole comprises an input light signal that is directed through a fluid sample housed in a sample cell. The input light signal may originate from a plurality of light sources. An output light signal from the sample cell is then routed to one or more spectrometers for measurement of the represented wavelengths in the output light signal. The output of the spectrometers is then compared to known values for hydrocarbons typically encountered downhole. This provides insight into the composition of the sample fluid. Additionally, the light from the light sources can be routed directly to the one or more spectrometers to be used in calibration of the system in the high temperature and noise environment downhole.


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