The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
May. 09, 2006
Richard A. Sones, Cleveland, OH (US);
Amir Novini, Akron, OH (US);
Richard A. Sones, Cleveland, OH (US);
Amir Novini, Akron, OH (US);
Applied Vision Company, LLC, Cuyahoga Falls, OH (US);
Abstract
A system and method to inspect objects for a characteristic parameter. The system includes at least one electromagnetic source for emitting at least two separate wavelengths of electromagnetic energy. At least one electromagnetic detector is positioned at a predefined distance from the electromagnetic source to measure an incident intensity value of the electromagnetic energy at the two wavelengths. An object, placed between the electromagnetic source and the electromagnetic detector is irradiated with electromagnetic energy at the two wavelengths and the electromagnetic energy transmitted through the object is measured by the electromagnetic detector. The system includes a computer-based platform operationally connected to the electromagnetic detector for receiving intensity data values from the electromagnetic detector and for computing attenuation ratio values. The attenuation ratio values are used to determine a level of the characteristic parameter.