The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
May. 01, 2005
Danny S. Moshe, Kiryat Ono, IL;
Danny S. Moshe, Kiryat Ono, IL;
Malcam Ltd., Tel-Aviv, IL;
Green Vision Systems Ltd., Tel-Aviv, IL;
Abstract
Bi-directional (longitudinal and angular) three-dimensional volumetric microwave scanning of a whole roll or pallet of paper (FIGS.), including three-dimensional volumetric mapping of internal properties and characteristics (moisture content, density, material uniformity, defects and types thereof, and variabilities thereof) of the roll or pallet of paper. Transmitted microwaves propagate through longitudinally and angularly defined portions of individual cross-sectional volumetric segments of the roll or pallet of paper. Microwave parameters (amplitude, phase) are perturbed by, and are a function of the internal properties and characteristics of, the contents of volumetric segment portions of the roll or pallet of paper. Microwave differential parameters (amplitude attenuation, phase shift) are calculated and used for calculating and determining values, relationships, two-dimensional graphs and maps, and, three-dimensional volumetric graphs and maps (FIGS.), of the internal properties and characteristics of at least part of the roll or pallet of paper.