The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Oct. 17, 2005
Kenneth R. Newton, Concord, CA (US);
August Specht, Walnut Creek, CA (US);
Kenneth R. Newton, Concord, CA (US);
August Specht, Walnut Creek, CA (US);
Varian, Inc., Palo Alto, CA (US);
Abstract
In some embodiments, a method of optimizing operating parameters of an analytical instrument (e.g. lens voltages of a mass spectrometer) includes steps taken to minimize the method duration in the presence of substantial instrument noise and/or drift. Some methods include selecting a best point between a default instrument parameter set (vector) and a most-recent optimum parameter set; building a starting simplex at the selected best point location in parameter-space; and advancing the simplex to find an optimal parameter vector. The best simplex points are periodically re-measured, and the resulting readings are used to replace and/or average previous readings. The algorithm convergence speed may be adjusted by reducing simplex contractions gradually. The method may operate using all-integer parameter values, recognize parameter values that are out of an instrument range, and operate under the control of the instrument itself rather than an associated control computer.