The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Feb. 22, 2005
Erik Gross, Palo Alto, CA (US);
Guangming Dai, Fremont, CA (US);
Charles Campbell, Berkeley, CA (US);
Erik Gross, Palo Alto, CA (US);
Guangming Dai, Fremont, CA (US);
Charles Campbell, Berkeley, CA (US);
AMO Manufacturing USA, LLC, Milpitas, CA (US);
Abstract
Systems and methods analyze, diagnose, and/or treat a patient's eye using modified forms of the point spread function ('PSF') tailored to the vision system. Factors that alter perception of visual aberrations can be included and/or volumetric point spread functions calculated, often using point spread function calculations throughout a range of optical distances to more fully indicate the variation in visual perception of optics at different distances. A variety of visual affects of the human optical system can be simulated, analyzed, and modeled, including: single versus multiple wavelength sources, chromatic aberrations, retinal resolution, wavelength-dependent visual response, Stiles-Crawford effects, and/or non-linearity of retinal response. The perceived point spread function can offer objective confirmation of the patient's visual perception, allow a treating physician to see a closer approximation of what the patient sees, indicate the scale and significance of wavefront aberrations, and/or show which aberrations affect vision and which do not.