The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2008
Filed:
Mar. 10, 2006
Robert J. Christ, Jr., Brentwood, NY (US);
Jerrell Anthony Nardiello, Hicksville, NY (US);
John M. Papazian, Great Neck, NY (US);
John Steven Madsen, Commack, NY (US);
Robert J. Christ, Jr., Brentwood, NY (US);
Jerrell Anthony Nardiello, Hicksville, NY (US);
John M. Papazian, Great Neck, NY (US);
John Steven Madsen, Commack, NY (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at least two of the target marks, and using a change in distance between at least two of the marks to determine strain in the test specimen. An apparatus that performs the method is also provided.