The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Feb. 09, 2004
Mark Ramacher, San Carlos, CA (US);
Graham S. Wood, El Granada, CA (US);
Juan Loaiza, Redwood City, CA (US);
Tirthankar Lahiri, Santa Clara, CA (US);
Karl Dias, Foster City, CA (US);
Mark Ramacher, San Carlos, CA (US);
Graham S. Wood, El Granada, CA (US);
Juan Loaiza, Redwood City, CA (US);
Tirthankar Lahiri, Santa Clara, CA (US);
Karl Dias, Foster City, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Quantifying the impact of wasteful operations on a database system is provided. One or more operations that are determined to be wasteful are received. The impact of the wasteful operations on performance in a database may then be quantified. The database is monitored to determine when a wasteful operation is being performed. When a wasteful operation is detected, a time value is recorded of the time spent on processing the wasteful operation. The time value is stored and used to quantify an impact of a performance problem in a database. The time value may be stored and associated with other time values that are recorded for the same wasteful operation. Thus, the impact of wasteful operations that are performed and processed in a database may be determined.