The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
May. 14, 2004
Hua-jun Zeng, Beijing, CN;
Gui-rong Xue, Beijing, CN;
Zheng Chen, Beijing, CN;
Benya Zhang, Beijing, CN;
Wei-ying MA, Beijing, CN;
Hua-Jun Zeng, Beijing, CN;
Gui-Rong Xue, Beijing, CN;
Zheng Chen, Beijing, CN;
Benya Zhang, Beijing, CN;
Wei-Ying Ma, Beijing, CN;
Microsoft Corporation, Redmond, WA (US);
Abstract
A method and system for measuring the similarity of objects based on relationships with objects of the same type and different types and similarities of those objects to other objects is provided. In one embodiment, the similarity system defines intra-type and inter-type similarity functions for each type of object. The similarity system may combine the intra-type and inter-type similarity functions for a certain type into an overall similarity function for that type. After defining the similarity functions, the similarity system collects attribute values for the objects, which may include relationship data between objects of the same type, referred to as intra-type relationships, and relationships between objects of different types, referred to as inter-type relationships. After collecting the attribute values for the objects, the similarity system solves the intra-type and inter-type similarity functions by iteratively calculating the similarities for the objects until the similarities converge on a solution.