The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2008

Filed:

Aug. 18, 2004
Applicant:

Bruce E. Aldridge, Oceanside, CA (US);

Inventor:

Bruce E. Aldridge, Oceanside, CA (US);

Assignee:

Teradata US, Inc., Miamisburg, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for determining shelf life and sell-through time for retail products. The solution employs a data warehouse, a self monitoring product and product traceability. The data warehouse is utilized to track delivery information throughout the supply chain, e.g., time, quantity, product information, traceability; return information of unsold inventory returned from a retailer or customer as saleable; return information of inventory returned as unsaleable, damaged or defective; and data relating to evaluation of returned inventory. A self monitoring product is one that is capable of recording events such as number of times the product has been used, time since initial use, cumulative time and other items of interest such as stress variables, dates, min/max values, updates, etc. The solution involves evaluation of all returned product and comparing the information on the self monitoring product with known information from the supply line and return results contained in the database. The returns effectively act as a sample of all products and provide information about the product shelf-life, use profiles, installation issues, abuse, defects, etc.


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