The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Mar. 29, 2006
Masatoshi Watanabe, Hyogo, JP;
Shigeru Matsumoto, Hyogo, JP;
Koichi Ohgaki, Hyogo, JP;
Kazumasa Iwakawa, Hyogo, JP;
Masatoshi Watanabe, Hyogo, JP;
Shigeru Matsumoto, Hyogo, JP;
Koichi Ohgaki, Hyogo, JP;
Kazumasa Iwakawa, Hyogo, JP;
Fujitsu Ten Limited, Hyogo, JP;
Abstract
A method for investigating a cause of decrease in frequency of abnormality detections for a certain device mounted on a vehicle, wherein when a plurality of abnormality detection conditions are satisfied, the abnormality detection for the certain device is performed to determine if the certain device is in failure, the method includes (i) when the frequency of the abnormality detections is below a predetermined value, disabling one of the abnormality detection conditions; (ii) when the abnormality detection conditions except the disabled abnormality detection condition are satisfied, performing an abnormality detection for the certain device; (iii) repeating the step (ii) a plurality of times; and (iv) determining if the disabled abnormality detection condition at that time is the cause of the decrease in the frequency of the abnormality detections, based on frequency of the abnormality detections in the step (iii).