The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
May. 12, 2006
Applicant:
James E. Rickett, Oakland, CA (US);
Inventor:
James E. Rickett, Oakland, CA (US);
Assignee:
Chevron U.S.A. Inc., San Ramon, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention includes a method for determining interval values of seismic quality factor, Q, from seismic data. Seismic data is recorded and preprocessed as necessary. Estimates of amplitude spectra are determined from the seismic data. Logarithms are taken of the amplitude spectra and weights derived from the amplitude spectra. Interval values of seismic quality factor, Q, are determined by performing a weighted fit to the log-amplitude spectra with a function that is parameterized by an initial wavelet, an attenuation profile (1/Q) and an absolute-scaling profile.