The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Aug. 05, 2005
Patrice Y. Simard, Bellevue, WA (US);
Henrique S. Malvar, Sammamish, WA (US);
Erin L. Renshaw, Kirkland, WA (US);
Patrice Y. Simard, Bellevue, WA (US);
Henrique S. Malvar, Sammamish, WA (US);
Erin L. Renshaw, Kirkland, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods for performing clustering of a document image are disclosed. A property of an extracted mark from a document is compared to the properties of the existing clusters. If the property of the mark fails to match any of the properties of the existing clusters, the mark is added as a new cluster to the existing cluster. One property that can be utilized is x size and y size, which is the width and height, of the existing clusters. Another property that can be employed is ink size, which refers to the ratio of black pixels to total pixels in a cluster. Yet another property that can be utilized is a reduced mark or image, which is a pixel size reduced version the bitmap of the mark and/or cluster. The above properties can be employed to identify mismatches and reduce the number of bit by bit comparisons performed.