The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Apr. 30, 2004
Robert D. Klein, Farmington Hills, MI (US);
Craig F. Lapan, Brighton, MI (US);
George E. Reasoner, Jr., Tecumseh, MI (US);
Robert D. Klein, Farmington Hills, MI (US);
Craig F. Lapan, Brighton, MI (US);
George E. Reasoner, Jr., Tecumseh, MI (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
An image quality assurance method for identifying image defects in a plurality of previously-imaged documents, where each previously-imaged document includes at least one image rendition stored in at least one image rendition file according to type of image rendition. The image renditions are analyzed to provide selected image metrics, the latter of which are compared against preselected image quality metric threshold values. An image quality flag is generated for any image rendition if at least one of the selected image metrics for that image rendition does not successfully compare against the preselected image quality metric threshold values. A record entry is created in an image quality flag file for those documents having at least one flagged image rendition, the record entry including information about the selected image metrics of the at least one flagged image rendition for that imaged document. Image defects in a plurality of imaged documents can be identified by examining the record entries in the image quality flag file.