The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Apr. 16, 2003
Applicants:
Achim Kirsch, Hamburg, DE;
Olavi Ollikainen, Tallinn, EE;
Inventors:
Achim Kirsch, Hamburg, DE;
Olavi Ollikainen, Tallinn, EE;
Assignee:
Evotec Oai AG, Hamburg, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for analyzing chemical and/or biological samples comprises the production of a particle image () of at least one particle included in the sample. Subsequently, a particle surface () of the at least one particle included in the particle image () is divided into particle zones (). According to the invention, zone-dependent particle data are subsequently acquired in different states (z, z, z), which then can be evaluated.