The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2008

Filed:

Jun. 16, 2005
Applicants:

Akinobu Sato, Soka, JP;

Akiko Suzuki, Akishima, JP;

Emmanuel Bourelle, Tachikawa, JP;

Inventors:

Akinobu Sato, Soka, JP;

Akiko Suzuki, Akishima, JP;

Emmanuel Bourelle, Tachikawa, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 15/02 (2006.01); H01Q 19/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A direction-change element for changing the direction of travel of an incident electromagnetic wave and electromagnetic wave transmitting/receiving elements are disposed on a substrate. The direction-change element has a periodic array of materials of different refractive indexes arranged in parallel to the substrate surface. The electromagnetic wave transmitting/receiving elements are positioned at opposite ends of the periodic array in the direction of its arrangement. The output ratio between the two electromagnetic wave transmitting/receiving elements can be used to detect the incidence angle of the electromagnetic wave with high accuracy. By changing the relative intensity of electromagnetic waves to be sent from the two electromagnetic wave transmitting/receiving elements, it is possible to achieve high-accuracy control of the angle of emittance of the electromagnetic wave to be sent from the device. Accordingly, the present invention offers a small, low-profile electromagnetic wave transmitting/receiving device capable of detecting and radiating electromagnetic waves with high accuracy of their incidence and emittance angles.


Find Patent Forward Citations

Loading…