The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Aug. 16, 2005
Purusottam Mookerjee, Bridgewater, NJ (US);
Frank J. Reifler, Cinnaminson, NJ (US);
Purusottam Mookerjee, Bridgewater, NJ (US);
Frank J. Reifler, Cinnaminson, NJ (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
This invention relates to state estimation after processing time-delayed measurements with unknown biases that may vary arbitrarily in time within known physical bounds. These biased measurements are obtained from systems characterized by state variables and by multidimensional parameters, for which the latter are also unknown and may vary arbitrarily in time within known physical bounds. If a measurement is time-late, apply the measurements to an out-of-sequence filter using a mean square optimization criterion that accounts for all sources of uncertainty and delay time, to produce estimates of the true states of the system. If the measurement is not time-late, apply the measurements to an in-sequence filter using a mean square optimization criterion that accounts for all sources of uncertainty to produce estimates of the true states of the system. The estimates are applied to one of (a) making a decision, (b) operating a control system, and (c) controlling a process.