The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
Nov. 08, 2005
Applicants:
Yi-chuan Chen, Taipei, TW;
Hong-ching Chen, Kao-Hsiung Hsien, TW;
Inventors:
Yi-Chuan Chen, Taipei, TW;
Hong-Ching Chen, Kao-Hsiung Hsien, TW;
Assignee:
MediaTek Inc., Hsin-Chu Hsien, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A testing method utilizing at least one signal between ICs includes: coupling at least one testing device to a plurality of ICs that are capable of being tested by the testing device, the ICs including at least a first IC and a second IC; coupling the second IC to the first IC to utilize at least one output signal of the first IC to be at least one input signal of the second IC; and testing the second IC by utilizing the testing device and the output signal of the first IC.