The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2008

Filed:

Apr. 22, 2005
Applicants:

David Treves, Palo Alto, CA (US);

Thomas A. O'dell, Campbell, CA (US);

Inventors:

David Treves, Palo Alto, CA (US);

Thomas A. O'Dell, Campbell, CA (US);

Assignee:

WD Media, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical test head comprises one or more optical input paths by which a beam of light is communicated from a light source to a workpiece and one or more optical output paths by which light reflected off of the workpiece is communicated to a detector. The input optical path and the output optical path can include one or more mirrors and one or more lenses. At least one of the optical paths includes a layer for trapping and/or absorbing stray light. One or more of the lenses includes an anti-reflective coating for reducing noise caused by unwanted light reflection off of the lenses. The optical paths include one or more masks reducing stray light. The one or more masks can have an adjustable aperture (e.g. an iris).


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