The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2008

Filed:

Sep. 29, 2005
Applicants:

Ichiro Hasegawa, Naka-gun, JP;

Kenji Izaki, Naka-gun, JP;

Hirohide Kobayashi, Naka-gun, JP;

Kazuo Ino, Naka-gun, JP;

Nobuyuki Kanazawa, Hitachi, JP;

Inventors:

Ichiro Hasegawa, Naka-gun, JP;

Kenji Izaki, Naka-gun, JP;

Hirohide Kobayashi, Naka-gun, JP;

Kazuo Ino, Naka-gun, JP;

Nobuyuki Kanazawa, Hitachi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/208 (2006.01);
U.S. Cl.
CPC ...
Abstract

A ZnS (Ag) scintillation detector comprises a ZnS (Ag) scintillators layerwhich is excited by incident α-rays and emits a scintillator light, a photomultiplier tubewhich converts the scintillator light into an electric pulse signal, and a counting rate meterwhich counts the obtained pulse signal. The scintillator layer has a thickness which is not less than a range of α-rays from α-ray emitting nuclides (natural radioactive nuclides) to be separated, which enables energy absorption of α-rays from the α-ray emitting nuclides to be separated to entirely occur in the scintillator layer, and which enables light shielding of the scintillator light generated in the scintillator layer by the scintillator layer itself to be neglected. A pulse height discrimination circuitis further provided in a preceding stage of the counting rate meter. Thereby, the effect of the natural radioactive nuclides can be reduced and the contamination control can be efficiently and smoothly performed.


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