The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2008

Filed:

Mar. 16, 2001
Applicants:

Jens Klein, Heidelberg, DE;

Wolfram Stichert, Heidelberg, DE;

Wolfgang Strehlau, Dossenheim, DE;

Armin Brenner, Spiesheim, DE;

Stephan Andreas Schunk, Heidelberg, DE;

Dirk Demuth, Nussloch, DE;

Inventors:

Jens Klein, Heidelberg, DE;

Wolfram Stichert, Heidelberg, DE;

Wolfgang Strehlau, Dossenheim, DE;

Armin Brenner, Spiesheim, DE;

Stephan Andreas Schunk, Heidelberg, DE;

Dirk Demuth, Nussloch, DE;

Assignee:

BASF Aktiengesellschaft, Ludwigshafen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/10 (2006.01); G01N 30/88 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A process and apparatus for testing material libraries, in particular catalysts, by means of coupled use of at least two analytical methods, preferably IR thermography and mass spectrometry. Owing to the selected arrangement, the disadvantages of the two previously known individual methods are compensated for: the subsequent selectivity determination for selected sections by means of mass spectrometry invalidates the argument against IR thermography, of only being able to determine activities; the rapid integrated determination of potentially 'good' materials via IR thermography prevents an excessive loss of time by needing to test all materials of a library successively with the mass spectrometer. The reactor design permits, firstly, the integral recording of the entire reactor through a window which is transparent for the corresponding method and, secondly, permits the simultaneous, automated application of a second analytical method (for example mass spectrometry) to selected materials of a material library, which have been rated as active by the optical method. In the case described, the optical method provides information on the material activity for a set problem, and the second analytical method determines the selectivity of the materials.


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