The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2008
Filed:
May. 03, 2005
John F. Palma, San Ramon, CA (US);
Eric B. Schell, Mountain View, CA (US);
Alan J. Williams, Albany, CA (US);
John F. Palma, San Ramon, CA (US);
Eric B. Schell, Mountain View, CA (US);
Alan J. Williams, Albany, CA (US);
Affymetrix, Inc., Santa Clara, CA (US);
Abstract
The invention provides arrays for analysis of compromised nucleic acid samples, for example, nucleic acids obtained from formalin fixed paraffin embedded samples and methods to analyzed these compromised samples. Arrays are disclosed in which the probe selection region used to select probes for the array is the 300 bases of the target MRNA that are immediately upstream of the start of the poly(A) tail of the mRNA. The probes selected for the array are more biased toward the 3' end of the mRNA than other arrays that are currently available.